This paper presents a simple method to measure the interfacial capacitance of PEDOT-PSS films by measuring the contact resistance at the metal semiconductor junction. Rectifying behavior was identified for tin and copper contacting PEDOT-PSS films and the order of contact resistance was estimated by a diode model. In this work determination of bulk and contact resistances was made using standard four probe measurement methods. It was found that the contact resistance offered by the metal semiconductor junction is nearly 6 to 7 times more than the bulk resistance of the film. Large contact resistances compared to rest of the film can pose problems as a device. In this study we report that there is an existence of large capacitance at the metal semiconductor interfacial which varies with frequency and applied bias. Existence of large capacitance at the metal semiconductor junction of PEDOT-PSS makes it a contender to be used as super capacitors and is a suitable material to be explored as storage devices. This work can be used to model the performance precisely considering interconnect and contacts in parametric analysis of the circuit.